The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Jun. 26, 2018
Applicant:

Mitutoyo Corporation, Kanagawa-ken, JP;

Inventor:

Scott Ellis Hemmings, Edmonds, WA (US);

Assignee:

Mitutoyo Corporation, Kanagawa-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 21/04 (2006.01); G01R 1/073 (2006.01); G01B 5/008 (2006.01); G05B 19/401 (2006.01);
U.S. Cl.
CPC ...
G01B 21/047 (2013.01); G01B 5/008 (2013.01); G01R 1/073 (2013.01); G05B 19/401 (2013.01); G01B 2210/60 (2013.01); G05B 2219/25294 (2013.01); G05B 2219/49304 (2013.01); G05B 2219/50063 (2013.01);
Abstract

A set of respective self-configuring probe interface circuit boards (SC-MPIC's) are disclosed for use with a measurement system comprising host electronics and respective interchangeable measurement probes. Member SC-MPICs each comprises: a local circuit (LS) for probe identification, signal processing and inter-board signal control; and higher-direction and lower-direction connectors 'pointing' toward and away from the measurement probe, respectively. Member SC-MPICs establish a processing hierarchy by generating lower board present signals on their higher-direction connector, higher board present signals on their lower-direction connector, and determining whether they are the highest and/or lowest SC-MPIC based on receiving those signals from adjacent SC-MPICs. They can independently perform probe identification matching operations using probe identification data from compatible and incompatible probes, and the highest SC-MPIC does this first. Member SC-MPICs advantageously pass through or isolate signals from other members in the set depending on the hierarchy, various received signals, and internal processing.


Find Patent Forward Citations

Hemmings, Scott. (2021). Self-configuring component identification and signal processing system for a coordinate measurement machine (U.S. Patent No. 11175131). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11175131

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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