The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Nov. 21, 2018
Applicant:

Csmc Technologies Fab2 Co., Ltd., Jiangsu, CN;

Inventors:

Shikang Cheng, Wuxi New District, CN;

Yan Gu, Wuxi New District, CN;

Sen Zhang, Wuxi New District, CN;

Assignee:

CSMC TECHNOLOGIES FAB2 CO., LTD., Wuxi New District, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 21/265 (2006.01); H01L 21/266 (2006.01); H01L 29/08 (2006.01); H01L 29/10 (2006.01); H01L 29/423 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66712 (2013.01); H01L 21/266 (2013.01); H01L 21/26513 (2013.01); H01L 29/086 (2013.01); H01L 29/1095 (2013.01); H01L 29/42364 (2013.01); H01L 29/7802 (2013.01);
Abstract

A method for manufacturing a semiconductor device and an integrated semiconductor device, said method comprising: providing an epitaxial layer having a first region and a second region, forming, in the first region, at least two second doping-type deep wells, and forming, in the second region, at least two second doping-type deep wells; forming a first dielectric island between the second doping-type deep wells and forming a second dielectric island on the second doping-type deep wells; forming a first doping-type trench on two sides of the first dielectric island in the first region; forming a gate structure on the first dielectric island; and forming a separated first doping-type source region by using the second dielectric island as a mask, the first doping-type trench extending, in the first region, transversally to the first doping-type source region.


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