The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Oct. 22, 2019
Micron Technology, Inc., Boise, ID (US);
Kishore Kumar Muchherla, Fremont, CA (US);
Sampath K. Ratnam, Boise, ID (US);
Scott A. Stoller, Boise, ID (US);
Preston A. Thomson, Boise, ID (US);
Kevin R. Brandt, Boise, ID (US);
Marc S. Hamilton, Eagle City, ID (US);
Christopher S. Hale, Boise, ID (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
A processing device in a memory system detects a data loss occurrence in a block of a memory component. The processing device identifies a behavioral criterion associated with the data loss occurrence in the block of the memory component. The processing device further increments a counter associated with the block in response to an occurrence of the behavioral criterion, wherein a value of the counter corresponds to a number of occurrences of a plurality of behavioral criteria associated with data loss occurrences in the block. Responsive to determining that the value of the counter satisfies a first threshold criterion, the processing device designates the block as a quarantined block, performs a stress test of a plurality of stress tests of the block, and responsive to the block failing a first stress test, the processing device retires the block of the memory component.