The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Dec. 23, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Tarik Tosun, Brooklyn, NY (US);

Eric Mitchell, Stanford, CA (US);

Ben Eisner, New York, NY (US);

Jinwook Huh, Millburn, NJ (US);

Bhoram Lee, Princeton, NJ (US);

Daewon Lee, Princeton, NJ (US);

Volkan Isler, Saint Paul, MN (US);

Sebastian Seung, Princeton, NJ (US);

Daniel Lee, Tenafly, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/38 (2017.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/38 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/30241 (2013.01); G06T 2207/30244 (2013.01);
Abstract

An apparatus for estimating a trajectory of a tool may include: a memory storing instructions; and a processor configured to execute the instructions to: receive a task to be performed by the tool on a target object; receive a grayscale image and a depth image of the target object; and estimate a tool trajectory for performing the task, from the grayscale image and the depth image, via a pixels-to-plans neural network that is trained based on a labeled tool trajectory that is generated from a point cloud model of the target object.


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