The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Feb. 25, 2021
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventor:

Naoki Inoue, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/15 (2015.01);
U.S. Cl.
CPC ...
H04B 17/15 (2015.01);
Abstract

A test control unit executes first measurement of changing the power of a transmission signal transmitted by the mobile terminal in a first range and second measurement of changing the power of the transmission signal transmitted by the mobile terminal in a second range lower than the first range, determines a first threshold THand a second threshold THbased on the measurement resultof the second measurement, and divides the measurement period into a first measurement period Tr, a second measurement period Tr, and a third measurement period Trc, based on the first threshold THand the second threshold TH. The test control unit determines, as a test result, a measurement resultmeasured in the second measurement in the first measurement period Trand the second measurement period Tr, and a measurement resultmeasured in the first measurement in a third measurement period Trc.


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Inoue, Naoki. (2021). Mobile terminal testing apparatus, mobile terminal testing system, and control method for mobile terminal testing apparatus (U.S. Patent No. 11165518). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11165518

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