The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Feb. 07, 2012
Applicants:

Dhananjay Adhikari, Austin, TX (US);

Zhong-ning George Cai, Lake Oswego, OR (US);

Jacob Schneider, Austin, TX (US);

Inventors:

Dhananjay Adhikari, Austin, TX (US);

Zhong-Ning George Cai, Lake Oswego, OR (US);

Jacob Schneider, Austin, TX (US);

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/34 (2006.01);
U.S. Cl.
CPC ...
H01L 23/34 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A system may include determination of a spatial power map associated with an integrated circuit based on an architecture of the circuit, generation of a spatial thermal map associated with the integrated circuit based on the spatial power map, and determination of a spatial leakage power map based on the spatial thermal map. In some aspects, a system includes determination of a temperature of an integrated circuit, comparison of the temperature with a thermal divergence temperature, determination that the temperature of the integrated circuit is primarily due to leakage power, and disabling of power to the integrated circuit.


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