The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Mar. 08, 2019
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Kippei Sugita, Miyagi, JP;

Daisuke Kawano, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); H01J 37/32 (2006.01); G01D 5/241 (2006.01); G01R 27/26 (2006.01); G01B 7/06 (2006.01); H01J 9/42 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32642 (2013.01); G01D 5/2417 (2013.01); G01R 27/2605 (2013.01); H01J 37/32935 (2013.01); G01B 7/06 (2013.01); G01B 7/08 (2013.01); H01J 9/42 (2013.01); H01J 37/32009 (2013.01);
Abstract

A measuring device and method, provided in a region surrounded by a focus ring and configured to measure an amount of consumption of the focus ring, includes a disc-shaped base substrate, sensor electrodes provided on the base substrate, a high frequency oscillator configured to apply a high frequency signal to the sensor electrodes, and an operation unit configured to calculate measurement values indicating electrostatic capacitances of the sensor electrodes from detection values corresponding to potentials of the sensor electrodes. The operation unit calculates a representative value (for example an average value) of the measurement values corresponding to the amount of consumption of the focus ring and derives the amount of consumption of the focus ring with reference to a table in which the amount of consumption of the focus ring is associated with the representative value of the measurement values.


Find Patent Forward Citations

Loading…