The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Jun. 29, 2017
Carl Zeiss Microscopy Gmbh, Jena, DE;
Jörg Siebenmorgen, Jena, DE;
Helmut Lippert, Jena, DE;
Thomas Kalkbrenner, Jena, DE;
Ingo Kleppe, Jena, DE;
Ralf Wolleschensky, Jena, DE;
Artur Degen, Jena, DE;
Matthias Wald, Jena, DE;
Lars-Christian Wittig, Jena, DE;
Michael Gölles, Jena, DE;
Wolfgang Singer, Aalen, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
An arrangement for microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen on a specimen carrier. An optical axis of the illumination objective lies in a plane which includes an illumination angle that differs from zero with the normal of a specimen plane and the illumination is implemented in the plane. A detection optical unit with a detection objective is located in a detection beam path. The optical axis of the detection objective includes a detection angle that differs from zero with the normal of the specimen plane. The illumination objective and/or the detection objective has an illumination correction element. A meniscus lens is located between the specimen carrier and the illumination and detection objectives being arranged both in the illumination beam path and in the detection beam path.