The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Apr. 17, 2019
Industrial Technology Research Institute, Hsinchu, TW;
Kai-Ming Pan, Taoyuan, TW;
Ta-Jen Peng, Taichung, TW;
Yen-Cheng Chen, Taichung, TW;
Qi-Zheng Yang, Taoyuan, TW;
Chen-Yu Kai, Pingtung County, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A measuring program compiling device and a measuring program compiling method thereof are provided. The method includes analyzing a first measuring program to obtain a plurality of first measuring parameters corresponding to the first measuring program, and converting the first measuring parameters into a plurality of second measuring parameters corresponding to a plurality of planning operations; generating a plurality of standardized measuring parameters according to the second measuring parameters and a plurality of computer aided design (CAD) image parameters; receiving a plurality of parameter input operations corresponding to the planning operations to update the second measuring parameters; generating a standardized measuring program corresponding to a CAD file according to the standardized measuring parameters; and converting the standardized measuring program into a target measuring program executed on a target measuring device according to specification data of the target measuring device.