The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

May. 29, 2020
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Daniel S. Froelich, Portland, OR (US);

Debendra Das Sharma, Saratoga, CA (US);

Fulvio Spagna, San Jose, CA (US);

Per E. Fornberg, Portland, OR (US);

David Edward Bradley, Fort Collins, CO (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/08 (2006.01); G06F 13/14 (2006.01); G06F 11/10 (2006.01); G06F 11/22 (2006.01); H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/08 (2013.01); G06F 11/1004 (2013.01); G06F 11/221 (2013.01); G06F 13/14 (2013.01); H04L 1/0061 (2013.01);
Abstract

There is disclosed in an example an interconnect apparatus having: a root circuit; and a downstream circuit comprising at least one receiver; wherein the root circuit is operable to provide a margin test directive to the downstream circuit during a normal operating state; and the downstream circuit is operable to perform a margin test and provide a result report of the margin test to the root circuit. This may be performed in-band, for example in the L0 state. There is also disclosed a system comprising such an interconnect, and a method of performing margin testing.


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