The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Dec. 19, 2019
Applicant:
Jeol Ltd., Tokyo, JP;
Inventors:
Yuki Endo, Tokyo, JP;
Masahide Nishiyama, Tokyo, JP;
Assignee:
JEOL Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/30 (2006.01);
U.S. Cl.
CPC ...
G01R 33/307 (2013.01);
Abstract
A rotational force is applied to a sample tube by blowing of a drive gas to the sample tube. A spinning frequency of the sample tube is sequentially detected as a detection value. Acceleration control to gradually increase a pressure of the drive gas is executed until the detection value reaches a target value. In a process of the acceleration control, abnormality is determined based on a change with respect to time (difference: ΔF) of the detection value. The determination is executed in a section of interest including a resonance frequency.