The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2021

Filed:

Nov. 13, 2018
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Leon Chen, San Jose, CA (US);

Rotem Nahum, Sunnyvale, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31718 (2013.01); G01R 31/3172 (2013.01);
Abstract

A system for performing an automated test is disclosed. The method comprises receiving a plurality of work orders and a plurality of constraints for scheduling a plurality of tests on a plurality of DUTs using automated test equipment (ATE) available on a production floor, wherein the ATE comprises a plurality of test cells, and wherein each test cell comprises a plurality of testers and an automated handler. The method further comprises developing a test plan to execute the plurality of tests, wherein the test plan is customized in accordance with the information in the plurality of work orders and the plurality of constraints. Finally, the method comprises scheduling the plurality of tests to the plurality of test cells to maximize throughput of the plurality of DUTs.


Find Patent Forward Citations

Loading…