The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Dec. 05, 2019
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Daniel C. Middleton, Orono, MN (US);

Jianbo Shi, Philadelphia, PA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); H04N 13/271 (2018.01); G06T 3/00 (2006.01); G06T 5/00 (2006.01); H04N 13/111 (2018.01); G06T 15/20 (2011.01); G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
H04N 13/271 (2018.05); G06T 3/0093 (2013.01); G06T 5/005 (2013.01); G06T 7/50 (2017.01); G06T 15/20 (2013.01); H04N 13/111 (2018.05); G06T 2207/10028 (2013.01);
Abstract

Techniques are provided for synthesis of transformed image views, based on a reference image, using depth information. The transformed image views may simulate a change in position or focal length of a camera that produced the reference image. An example system includes an image transformation circuit configured to transform the reference image corresponding to a first viewpoint, to a transformed image corresponding to a second viewpoint. The system also includes an inverse warping circuit configured to calculate a mapping from the pixels of the transformed image to corresponding pixels of the reference image. The system further includes a hole detection circuit configured to detect holes in the transformed image based on depth discontinuities between the reference and transformed images; and a hole filling circuit configured to in-fill the detected holes using a sampling of selected neighboring pixels from the reference image, to synthesize a view based on the transformed image.


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