The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
May. 13, 2019
Carl Zeiss Microscopy Gmbh, Jena, DE;
Josef Biberger, Wildenberg, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method for positioning a specimen in a microscope system includes overserving and/or processing a region of interest (ROI) on the specimen. The microscope system includes: an optical axis; a movable specimen stage for receiving a specimen; a memory apparatus for storing data records that describe the positions of the specimen; and a control apparatus, which can control the movement of the specimen stage with the aid of the stored data records. The method includes: holding a specimen region (ROI) in the first position; storing a first data record, by which the first position is described, wherein the first position is defined as independent position; storing a second data record, by which the second position is described, wherein the second position is linked to the independent position; and calling one of the stored data records such that the specimen stage is moved in such a way that the specimen region is held at the position that is described by the called data record.