The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Feb. 16, 2021
Changxin Memory Technologies, Inc., Anhui, CN;
Ruei-Yuan Guo, Hefei, CN;
Changxin Memory Technologies, Inc., Hefei, CN;
Abstract
A chip testing method, device, electronic apparatus, and computer readable medium are provided, relating to the field of chip testing. The method includes: determining a language rule of a chip to be tested; determining product and timing specifications of the chip to be tested; selecting a test pattern from a test pattern library according to the language rule and the product and timing specifications; generating a test code according to the product and timing specifications and the test pattern; and automatically testing the chip to be tested by using the test code. The chip testing method, device, electronic apparatus and computer readable medium can automatically generate a big-data test code for complex memories, and rapidly generate, in a standardized way, test codes for DDR4 memories of different specifications, thereby improving the efficiency of chip product verification analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile