The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Jul. 22, 2010
Applicants:

Dirk Preikszas, Oberkochen, DE;

Michael Albiez, Aalen, DE;

Inventors:

Dirk Preikszas, Oberkochen, DE;

Michael Albiez, Aalen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/09 (2006.01); H01J 37/141 (2006.01); H01J 37/15 (2006.01); H01J 37/28 (2006.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
H01J 37/09 (2013.01); H01J 37/15 (2013.01); H01J 37/265 (2013.01); H01J 37/28 (2013.01); H01J 2237/0455 (2013.01); H01J 2237/0492 (2013.01); H01J 2237/14 (2013.01); H01J 2237/2002 (2013.01); H01J 2237/26 (2013.01); H01J 2237/31749 (2013.01);
Abstract

A particle beam apparatus includes a first aperture unit having an adjustable aperture opening. The particle beam apparatus may include a first condenser lens having a first pole shoe and a second pole shoe. Both the first pole shoe and the second pole shoe may be adjustable relative to a second aperture unit independently of each other. The second aperture unit may be designed as a pressure stage aperture separating a first area having a vacuum at a first pressure, and a second area having a vacuum at a second pressure. Additionally, a method for adjusting a beam current in a particle beam apparatus is provided.


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