The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Sep. 08, 2017
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:
Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); H01L 21/027 (2006.01); H01L 23/00 (2006.01); H01L 21/768 (2006.01); H01J 37/317 (2006.01); G06F 30/392 (2020.01); G06F 30/394 (2020.01); G06F 119/18 (2020.01);
U.S. Cl.
CPC ...
G03F 7/70383 (2013.01); H01J 37/3174 (2013.01); H01L 21/027 (2013.01); H01L 21/0274 (2013.01); H01L 21/0277 (2013.01); H01L 21/76816 (2013.01); H01L 23/573 (2013.01); G06F 30/392 (2020.01); G06F 30/394 (2020.01); G06F 2119/18 (2020.01); H01J 2237/31764 (2013.01);
Abstract

A method of creating electronic devices such as semiconductor chips using a maskless lithographic exposure system such as a charged particle multi-beamlet lithography system (A-D). The maskless lithographic exposure system comprises a lithography subsystem () including a maskless pattern writer such as a charged particle multi-beamlet lithography machine () or ebeam machine. The method comprises introducing unique chip design data () or information related thereto into pattern data comprising common chip design data before streaming the pattern data to the maskless pattern writer.


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