The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Aug. 03, 2018
Applicant:

Hoya Corporation, Tokyo, JP;

Inventors:

Tsutomu Shoki, Tokyo, JP;

Kazuhiro Hamamoto, Tokyo, JP;

Yohei Ikebe, Tokyo, JP;

Assignee:

HOYA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/02 (2006.01); C23C 14/35 (2006.01); C23C 14/46 (2006.01); G03F 1/24 (2012.01); G03F 1/38 (2012.01); G03F 1/84 (2012.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G03F 1/84 (2013.01); C23C 14/024 (2013.01); C23C 14/35 (2013.01); C23C 14/46 (2013.01); G03F 1/24 (2013.01); G03F 1/38 (2013.01); G06T 7/0004 (2013.01); G06T 2207/30148 (2013.01); G06T 2207/30204 (2013.01);
Abstract

A method of manufacturing a reflective mask blank comprising a multilayer reflective film formed on a substrate so as to reflect EUV light; and a laminated film formed on the multilayer reflective film. The method includes the steps of depositing the multilayer reflective film on the substrate to form a multilayer reflective film formed substrate; carrying out defect inspection for the multilayer reflective film formed substrate; depositing the laminated film on the multilayer reflective film of the multilayer reflective film formed substrate; forming a fiducial mark for an upper portion of the laminated film to thereby form a reflective mask blank comprising the fiducial mark, the fiducial mark serving as a reference for a defect position in defect information; and carrying out defect inspection of the reflective mask blank by using the fiducial mark as a reference.


Find Patent Forward Citations

Loading…