The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2021
Filed:
Jun. 30, 2017
Applicant:
Technoprobe S.p.a., Cernusco Lombardone, IT;
Inventor:
Giuseppe Crippa, Cernusco Lombardone, IT;
Assignee:
Technoprobe S.p.A., Cernusco Lombardone, IT;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 3/00 (2006.01); H01R 13/03 (2006.01); H01R 13/24 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06761 (2013.01); G01R 1/06716 (2013.01); G01R 1/06738 (2013.01); G01R 3/00 (2013.01); H01R 13/03 (2013.01); H01R 13/2464 (2013.01);
Abstract
It is described a contact probe for a testing head of an apparatus for testing electronic devices including a body essentially extended along a longitudinal direction between a contact tip and a contact head, that contact probe comprising at least one multilayer structure, in turn including a superposition of at least one inner layer or core and a first inner coating layer, and an outer coating layer that completely covers the multilayer structure and made of a material having a higher hardness than a material realizing the core.