The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Aug. 10, 2020
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Robert M. Lugg, Hillsboro, OR (US);

Jay A. Hiserote, Hillsboro, OR (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/30 (2020.01); G06N 20/00 (2019.01); G06F 30/398 (2020.01); G06F 30/27 (2020.01); G03F 1/36 (2012.01); G03F 7/20 (2006.01); G06F 119/18 (2020.01); G06F 119/02 (2020.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06F 30/398 (2020.01); G03F 1/36 (2013.01); G03F 7/70441 (2013.01); G06F 30/27 (2020.01); G06N 20/00 (2019.01); G06F 2119/02 (2020.01); G06F 2119/18 (2020.01); G06N 3/08 (2013.01);
Abstract

Training data may be collected for each design intent in a set of design intents by identifying a set of failures that is expected to occur when the design intent is manufactured, and recording a failure mode and a location of each failure in the set of failures. Next, the training data may be used to train a machine learning model, e.g., an artificial neural network, to predict failure modes and locations of failures. The trained machine learning model, e.g., trained artificial neural network, can then be used to predict a set of failures for a given design intent. Next, for each predicted failure, a reticle enhancement technique (RET) recipe may be selected based on the failure mode of the failure, and the selected RET recipe may be applied to an area around the location of the failure.


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