The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Mar. 07, 2018
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Renato Padilla, Jr., Folsom, CA (US);

Gary F. Besinga, Boise, ID (US);

Harish Singidi, Fremont, CA (US);

Gianni Stephen Alsasua, Rancho Cordova, CA (US);

Ashutosh Malshe, Fremont, CA (US);

Kishore Kumar Muchherla, Fremont, CA (US);

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Sampath Ratnam, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/0727 (2013.01); G06F 11/0751 (2013.01); G06F 11/3034 (2013.01); G06F 11/3072 (2013.01);
Abstract

A system configured to determine that a trigger condition has occurred that is related to an operation performed on a memory device of the system. Responsive to determining that the trigger condition has occurred, reordering error handling mechanisms of an error handling sequence based upon an error handling mechanism performance metric. Each error handling mechanism specifies operations to be performed to recover an error in the operation on the memory device.


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