The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Feb. 20, 2020
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventor:
Shigekazu Yamada, Tokyo, JP;
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/317 (2006.01); G11C 29/38 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31703 (2013.01); G01R 31/31706 (2013.01); G01R 31/31723 (2013.01); G01R 31/31725 (2013.01); G11C 29/38 (2013.01);
Abstract
A device includes a comparator, a reference signal node, a plurality of test signal nodes, and control logic. The reference signal node receives a reference signal. The reference signal node is coupled to a first input of the comparator. Each of the plurality of test signal nodes receives a corresponding test signal. The control logic is configured to initiate a comparison of each test signal to the reference signal via the comparator.