The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2021

Filed:

Aug. 22, 2019
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Electronic Devices & Storage Corporation, Tokyo, JP;

Inventors:

Hidekazu Inoto, Ota Tokyo, JP;

Osamu Takata, Yokohama Kanagawa, JP;

Naozumi Terada, Kawasaki Kanagawa, JP;

Hiroyoshi Kitahara, Yokohama Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/808 (2006.01); H01L 29/45 (2006.01); H01L 29/06 (2006.01);
U.S. Cl.
CPC ...
H01L 29/808 (2013.01); H01L 29/0653 (2013.01); H01L 29/45 (2013.01);
Abstract

A junction field effect transistor includes a first semiconductor layer of first conductivity type, an element isolation insulator disposed on the first semiconductor layer to partition an active area, a second semiconductor layer of second conductivity type, on the first semiconductor layer in the active area, and having an end in a first direction separated from the element isolation insulator, a source layer of second conductivity type, on the second semiconductor layer, the source layer having an impurity concentration higher than that of the second semiconductor layer, a drain layer of second conductivity type, on the second semiconductor layer, and separated from the source layer in a second direction, the drain layer having an impurity concentration higher than that of the second semiconductor layer, and a gate layer of first conductivity type, on the second semiconductor layer, and between and separated from the source and drain layers.


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