The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

Oct. 19, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Alex Joseph Varghese, Albany, NY (US);

Richard A. Conti, Katonach, NY (US);

Su Chen Fan, Cohoes, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/285 (2006.01); H01L 21/311 (2006.01); H01L 23/532 (2006.01);
U.S. Cl.
CPC ...
H01L 23/53238 (2013.01); H01L 21/2855 (2013.01); H01L 21/31116 (2013.01); H01L 21/76802 (2013.01); H01L 21/76846 (2013.01); H01L 21/76847 (2013.01); H01L 21/76877 (2013.01);
Abstract

Provided are embodiments for an MOL interconnect structure having low metal-to-metal interface resistance interconnect structure including one or more contacts of one or more devices formed on a substrate. A dielectric layer is formed on one or more devices. One or more trenches are formed in the dielectric layer. The MOL interconnect structure also includes a barrier layer formed on one or more portions of the dielectric layer, along with a metallization layer, wherein the metallization layer forms a metal-to-metal interface with the one or more contacts.


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