The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

Oct. 14, 2019
Applicant:

Disco Corporation, Tokyo, JP;

Inventor:

Hiroshi Morikazu, Tokyo, JP;

Assignee:

DISCO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/268 (2006.01); H01L 21/66 (2006.01); H01L 23/00 (2006.01); B23K 26/362 (2014.01);
U.S. Cl.
CPC ...
H01L 21/76898 (2013.01); B23K 26/362 (2013.01); H01L 21/268 (2013.01); H01L 22/26 (2013.01); H01L 24/05 (2013.01); H01L 2224/05025 (2013.01); H01L 2924/40102 (2013.01); H01L 2924/40501 (2013.01);
Abstract

A laser processing method for a substrate with a device formed on a front surface thereof and including an electrode pad, the method including: a laser beam applying step of applying the laser beam to the back surface of the substrate to form a fine hole in the substrate at a position corresponding to the electrode pad; a detecting step of detecting first plasma light emitted from the substrate at the same time that the fine hole is formed in the substrate by the laser beam applied thereto, and second plasma light emitted from the electrode pad; and a laser beam irradiation finishing step of stopping application of the laser beam when the second plasma light is detected in the detecting step. A peak power density of the laser beam to be applied is set in a range from 175 GW/cmor less to 100 GW/cmor more.


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