The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

Dec. 10, 2019
Applicant:

Yangtze Memory Technologies Co., Ltd., Wuhan, CN;

Inventors:

Guangdian Chen, Wuhan, CN;

Jin Xing Chen, Wuhan, CN;

Zheng Yi Cai, Wuhan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 35/00 (2006.01); G01R 31/265 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01); G01R 31/2653 (2013.01); H01L 21/67288 (2013.01);
Abstract

The present invention provides a method for calibrating verticality of a particle beam. The method includes: providing a baseplate having a first sensor and a second sensor; emitting the particle beam to the first sensor of the baseplate from an emitter, such that a first datum is collected when the first sensor receives the particle beam; emitting the particle beam to the second sensor of the baseplate from the emitter, such that a second datum is collected when the second sensor receives the particle beam; calculating a first calibrating datum based on the first datum and the second datum; and adjusting the baseplate or the emitter based on the first calibrating datum if the first calibrating datum is out of a first predetermined range.


Find Patent Forward Citations

Chen, Guangdian. (2021). Method for calibrating verticality of particle beam and system applied to semiconductor fabrication process (U.S. Patent No. 11112482). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11112482

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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