The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Oct. 30, 2018
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Kishore Kumar Muchherla, Fremont, CA (US);

Peter Sean Feeley, Boise, ID (US);

Sampath K. Ratnam, Boise, ID (US);

Ashutosh Malshe, Fremont, CA (US);

Christopher S. Hale, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/128 (2016.01); G06F 12/02 (2006.01); G06F 12/0897 (2016.01);
U.S. Cl.
CPC ...
G06F 12/0253 (2013.01); G06F 12/0246 (2013.01); G06F 12/0897 (2013.01); G06F 12/128 (2013.01);
Abstract

An amount of valid data for each data block of multiple data blocks stored at a first memory is determined. An operation to write valid data of a particular data block from the first memory to a second memory is performed based on the amount of valid data for each data block. A determination is made that a threshold condition associated with when valid data of the data blocks was written to the first memory has been satisfied. In response to determining that the threshold condition has been satisfied, the operation to write valid data of the data blocks from the first memory to the second memory is performed based on when the valid data was written to the first memory.


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