The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Jan. 24, 2019
International Business Machines Corporation, Armonk, NY (US);
Andrew Hicks, Wappingers Falls, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Ryan Rawlins, New Paltz, NY (US);
Eitan Farchi, Haifa, IL;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Systems, methods, and computer-readable media are described for expanding test space coverage for testing performed on a System Under Test (SUT) through iterative test case generation from combinatoric pairwise outputs. At each test case generation iteration, a new set of test vectors is generated that provides complete pairwise coverage of the test space but that does not include any overlapping test vector with any previously generated set of test vectors. As such, cumulative m-wise test space coverage (where 2<m≤n) is incrementally increased through each iteration until the iterative process ceases when a desired percentage of m-wise test space coverage is achieved.