The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Nov. 13, 2018
International Business Machines Corporation, Armonk, NY (US);
Emily A. Ray, Hastings on Hudson, NY (US);
Emmanuel Yashchin, Yorktown Heights, NY (US);
Peilin Song, Lagrangeville, NY (US);
Kevin G. Stawiasz, Bethel, CT (US);
Barry Linder, Hastings-on-Hudson, NY (US);
Alan Weger, Mohegan Lake, NY (US);
Keith A. Jenkins, New York, NY (US);
Raphael P. Robertazzi, Ossining, NY (US);
Franco Stellari, Waldwick, NJ (US);
James Stathis, Poughquag, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods and systems of detecting chip degradation are described. A processor may execute a test on a device at a first time, where the test includes executable instructions for the device to execute a task under specific conditions relating to a performance attribute. The processor may receive performance data indicating a set of outcomes from the task executed by the device during the test. The processor may determine a first value of a parameter of the performance attribute based on the identified subset. The processor may compare the first value with a second value of the parameter of the performance attribute. The second value is based on an execution of the test on the device at a second time. The processor may determine a degradation status of the device based on the comparison of the first value with the second value.