The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Aug. 20, 2019
Applicant:

Advantest Corporation, Tokyo, JP;

Inventor:

Jochen Rivoir, Magstadt, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/319 (2006.01); G01R 31/317 (2006.01); G01R 31/28 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31917 (2013.01); G01R 31/2846 (2013.01); G01R 31/2894 (2013.01); G01R 31/31702 (2013.01); G01R 31/31707 (2013.01); G01R 31/31708 (2013.01); G06F 11/22 (2013.01);
Abstract

An apparatus for determining a single decision function is configured to obtain measurements from a plurality of devices under test corresponding to stimulating signals applied to the plurality of devices under test. The stimulating signals correspond to a set of tests performed on the plurality of devices under test. The apparatus may further determine a subset of tests from the set of tests, such that the subset of tests is relevant for indicating whether the plurality of devices under test pass the set of tests. The apparatus may also determine the single decision function applicable to measurements from an additional device under test tested using the subset of tests, such that the single decision function is adapted to predict a test result for the set of tests on the basis of the subset of tests.


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