The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Dec. 20, 2019
Applicant:

Nanotronics Imaging, Inc., Cuyahoga Falls, OH (US);

Inventors:

Matthew C. Putman, Brooklyn, NY (US);

Vadim Pinskiy, Wayne, NJ (US);

James Williams, III, New York, NY (US);

Damas Limoge, New York, NY (US);

Aswin Raghav Nirmaleswaran, Brooklyn, NY (US);

Mario Chris, Brooklyn, NY (US);

Assignee:

Nanotronics Imaging, Inc., Cuyahoga Falls, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B29C 64/209 (2017.01); B33Y 10/00 (2015.01); G06K 9/62 (2006.01); G06N 3/04 (2006.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B29C 64/209 (2017.08); B33Y 10/00 (2014.12); B33Y 50/02 (2014.12); G06K 9/6269 (2013.01); G06K 9/6297 (2013.01); G06N 3/04 (2013.01);
Abstract

Additive manufacturing systems using artificial intelligence can identify an anomaly in a printed layer of an object from a generated topographical image of the printed layer. The additive manufacturing systems can also use artificial intelligence to determine a correlation between the identified anomaly and one or more print parameters, and adaptively adjust one or more print parameters. The additive manufacturing systems can also use artificial intelligence to optimize one or more printing parameters to achieve desired mechanical, optical and/or electrical properties.


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