The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Mar. 22, 2019
Toyota Motor Engineering & Manufacturing North America, Inc., Plano, TX (US);
University of Connecticut, Farmington, CT (US);
Donald McMenemy, Willington, CT (US);
Weiqiang Chen, Willington, CT (US);
Ali M. Bazzi, South Windsor, CT (US);
Krishna R. Pattipati, Mansfield, CT (US);
Shailesh N. Joshi, Ann Arbor, MI (US);
Toyota Motor Engineering & Manufacturing North America, Inc., Plano, TX (US);
University of Connecticut, Farmington, CT (US);
Abstract
Systems and methods for detecting a fault or model mismatch are disclosed. A system includes a processor, a memory, and one or more sensors. The sensors may detect data associated with an electronic device. The memory may store processor executable instructions to: compute Tand Q statistics, over a time period, and apply a model mismatch and fault detection logic based on the Tand Q statistics. The model mismatch and fault detection logic may: count consecutive instances where a Tstatistic exceeds a Tthreshold via a Tcounter, update a probability of fault based on the Tcounter, count consecutive instances where a Q statistic exceeds a Q threshold via a Q counter, update a probability of model mismatch based on the Q counter, and detect one of a fault or a model mismatch based on a probability of fault threshold and a probability of model mismatch threshold.