The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Nov. 21, 2018
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventor:

Chung-Yen Chou, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 45/00 (2006.01); H01L 27/24 (2006.01);
U.S. Cl.
CPC ...
H01L 45/1675 (2013.01); H01L 27/2436 (2013.01); H01L 45/1233 (2013.01); H01L 45/1253 (2013.01); H01L 45/146 (2013.01); H01L 45/1608 (2013.01); G11C 2213/52 (2013.01);
Abstract

A method for forming a memory device is provided. The method including forming a memory cell stack over a lower interconnect layer over a substrate, the memory cell stack includes a data storage layer over a bottom metal. A first dielectric layer is formed over the memory cell stack. A first masking layer is formed over the first dielectric layer. The first masking layer overlies a center portion of the first dielectric layer and leaves a sacrificial portion of the first dielectric layer uncovered. A first etch of the first dielectric layer is formed according to the first masking layer. An inter-metal dielectric (IMD) layer is formed over the memory cell stack. A top electrode is formed within the IMD layer over the memory cell stack. An upper interconnect layer is formed over the top electrode. The upper and lower interconnect layers comprise a different material than the top electrode.


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