The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Jun. 19, 2020
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Anshu Malani, Uttar Pradesh, IN;

Paras Mal Jain, Mountain View, CA (US);

Sudeep Mondal, Uttar Pradesh, IN;

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/33 (2020.01); G06F 30/327 (2020.01); G06F 119/12 (2020.01);
U.S. Cl.
CPC ...
G06F 30/33 (2020.01); G06F 30/327 (2020.01); G06F 2119/12 (2020.01);
Abstract

Techniques for verification of integrated circuit design are disclosed. A design relating to an integrated circuit is received (). The design includes a first parameterized element and a second parameterized element (). The first parameterized element is identified as a do-not-care (DNC) element based on usage of the first parameterized element in the design (). A plurality of models relating to the design are generated by a processing device (). A first value of the first parameterized element is not varied during the generating, based on the identification of the first parameterized element as a DNC element (). A second value of the second parameterized element is varied during the generating ().


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