Sense amplifier architecture for low supply voltage operations

Abstract

Systems and methods for reducing the energy per bit of memory cell sensing operations, such as memory read operations, by dynamically adjusting the body effect of data latch transistors during the sensing operations are described. A significant component of the energy required to perform the memory cell sensing operations may correspond with the parasitic currents through low threshold voltage (VT) transistors of data latches within sense amplifier circuits. In order to reduce the energy per bit of the memory cell sensing operations while using a reduced supply voltage for the data latches, the body effect of a select number of the low VT transistors within the data latches may be dynamically adjusted such that the body effect is minimized or nonexistent during the latching of new data into the data latches and then increased after the new data has been latched within the data latches.