The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Dec. 14, 2017
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventor:

Jonathan S. Dandy, Portland, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 35/00 (2006.01); G01R 1/44 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06766 (2013.01); G01R 1/06772 (2013.01); G01R 1/44 (2013.01); G01R 35/00 (2013.01); G01R 35/005 (2013.01);
Abstract

Disclosed is a test and measurement probe including a signal channel having an input series resistor with a series parasitic capacitance. The probe also includes an amplifier coupled to the signal channel. The amplifier includes a shunt parasitic capacitance. A variable shunt resistor is coupled to the signal channel and a ground. The variable shunt resistor can be set to match a resistance capacitance (RC) value associated with the series parasitic capacitance and the shunt. The probe can also include a variable series resistor coupled to the amplifier. The variable series resistor can be set to adjust for attenuation variation associated with the variable shunt resistor. Other embodiments may be described and/or claimed herein.


Find Patent Forward Citations

Loading…