The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Aug. 22, 2017
Kewpie Corporation, Tokyo, JP;
Brainpad Inc., Tokyo, JP;
Kotaro Furihata, Chofu, JP;
Takeshi Ogino, Chofu, JP;
Kenji Suzuki, Chofu, JP;
Hiromu Suzuki, Chofu, JP;
Taketoshi Yamamoto, Chofu, JP;
Mitsuhisa Ota, Minato, JP;
Yoshimitsu Imazu, Minato, JP;
Alejandro Javier Gonzalez Tineo, Tokyo, JP;
Yuta Yoshida, Tokyo, JP;
Yohei Sugawara, Tokyo, JP;
KEWPIE CORPORATION, Tokyo, JP;
BRAINPAD INC., Tokyo, JP;
Abstract
A food inspection apparatus includes: a conveyance unit; a light irradiation unit; an unit capturing an image of an inspection object A; a wavelength emphasis emphasizing a foreign substance specific wavelength characteristic of a foreign substance F from light having a wavelength of 300 nm to 1100 nm by using a first and/or second optical filter or a wavelength-specific light source; and an identification processing device identifying the foreign substance and including: a lightening unit normalizing the captured image with 256 or less of gradations into lightened data; and an identification unit having been provided with deep-learning of an identification processing of the foreign substance specific wavelength from the lightened data and identifying the foreign substance or a good item S in line from the lightened data obtained through capturing the image during conveyance of the inspection object.