The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2021

Filed:

Apr. 09, 2020
Applicant:

Infineon Technologies Austria Ag, Villach, AT;

Inventors:

Matteo Dainese, Munich, DE;

Canhua Li, Torrance, CA (US);

Andreas Moser, Maria-Rain, AT;

Wolfgang Wagner, Villach, AT;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/739 (2006.01); H01L 21/762 (2006.01); H01L 29/06 (2006.01); H01L 29/10 (2006.01); H01L 29/08 (2006.01); H01L 29/40 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7397 (2013.01); H01L 21/76224 (2013.01); H01L 29/0649 (2013.01); H01L 29/0696 (2013.01); H01L 29/0804 (2013.01); H01L 29/1095 (2013.01); H01L 29/407 (2013.01); H01L 29/66348 (2013.01);
Abstract

According to an embodiment of a semiconductor device, the device includes a semiconductor substrate having a transistor region and a diode region. The transistor region includes a plurality of IGBT cells, and a charge carrier compensation region configured to expel or admit drift zone minority charge carriers based on an on-state or an off-state of the IGBT cells. The diode region includes a plurality of diode cells. An isolation structure is provided between the transistor region and the diode region. The isolation structure includes a first trench extending lengthwise along at least part of a periphery of the diode region and a second trench interposed between the first trench and the transistor region. The charge carrier compensation region extends to the second trench of the isolation structure but not the first trench such that the charge carrier compensation region is electrically isolated from an anode potential of the diode region.


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