The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

Jul. 17, 2018
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Sheng Bi, Shanghai, CN;

Shi Bo Zhang, Shanghai, CN;

Yiran Liu, Boise, ID (US);

Yi Jun Lu, Shanghai, CN;

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 13/16 (2006.01); G06F 13/18 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0613 (2013.01); G06F 3/0604 (2013.01); G06F 3/0631 (2013.01); G06F 3/0653 (2013.01); G06F 3/0685 (2013.01); G06F 13/1663 (2013.01); G06F 13/18 (2013.01);
Abstract

A method for managing storage performance consistency, where the method determines a target throughput for writes to a memory sub-system, increases a tracking variable with a granularity based on the target throughput at fixed intervals, decreases the tracking variable based on writes of host data received from a host system to the memory sub-system, and adjusts a priority of host data writes to the memory sub-system relative to writes of reclaimed data from the memory sub-system in response to the tracking variable indicating a deviation from the target throughput.


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