The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2021

Filed:

May. 11, 2018
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Kentaro Konishi, Yamanashi, JP;

Hiroki Shikagawa, Yamanashi, JP;

Jun Fujihara, Yamanashi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H01L 21/67 (2006.01); G01J 5/00 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); H01L 21/68 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2831 (2013.01); G01J 5/0007 (2013.01); G01R 1/06794 (2013.01); G01R 1/07342 (2013.01); H01L 21/67242 (2013.01); H01L 21/68 (2013.01); G01J 2005/0081 (2013.01);
Abstract

An inspection system includes: an inspection section provided with an inspection part having a plurality of inspection units each including a tester that performs an electrical inspection of an inspection target, and a probe card provided between the tester and the inspection target; and a loader section including an arrangement part in which a storage container for the inspection target is disposed, and a loader that delivers the inspection target between the storage container and the inspection section. The inspection part includes a plurality of inspection unit rows that are formed by arranging the plurality of inspection units in one horizontal direction and arranged in a plurality of tiers in a vertical direction. The arrangement part is provided on an end part side in one direction of the inspection part.


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