The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Jan. 21, 2020
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Shih-Hsiang Lo, Hsinchu, TW;

Hsu-Ting Huang, Hsinchu, TW;

Ru-Gun Liu, Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 111/06 (2020.01); G06F 111/10 (2020.01); G03F 1/36 (2012.01); G03F 1/70 (2012.01); H01L 21/027 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G03F 1/36 (2013.01); G03F 1/70 (2013.01); G03F 7/705 (2013.01); G03F 7/70441 (2013.01); G03F 7/70516 (2013.01); G03F 7/70666 (2013.01); H01L 21/0274 (2013.01); G06F 2111/06 (2020.01); G06F 2111/10 (2020.01);
Abstract

Provided is a method for fabricating a semiconductor device including generating an ideal image using measured contour data and fitted conventional model terms. The method further includes using the fitted conventional model terms and a mask layout to provide a conventional model aerial image. In some embodiments, the method further includes generating a plurality of mask raster images using the mask layout, where the plurality of mask raster images is generated for each measurement site of the measured contour data. In various embodiments, the method also include training a neural network to mimic the ideal image, where the generated ideal image provides a target output of the neural network, and where the conventional model aerial image and the plurality of mask raster images provide inputs to the neural network.


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