The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Jun. 03, 2019
Applicant:
Jeol Ltd., Tokyo, JP;
Inventor:
Masako Ota, Tokyo, JP;
Assignee:
JEOL Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01); G06F 3/14 (2006.01); G09G 5/37 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8655 (2013.01); G01N 30/7206 (2013.01); G06F 3/14 (2013.01); G09G 5/37 (2013.01);
Abstract
A review image is displayed prior to measurement of an analysis target sample. The review image includes a waveform image and a numerical value image showing a measurement condition determined for a measurement segment of interest. The waveform image includes a waveform portion which is a part of a chromatogram, and a marker array showing a period of a circulating ion measurement. The marker array includes a plurality of markers which are displayed in an overlapping manner over the waveform portion.