The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Feb. 04, 2019
Applicant:

Ebara Corporation, Tokyo, JP;

Inventor:

Hiroaki Nishida, Tokyo, JP;

Assignee:

EBARA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/68 (2006.01); B23Q 3/18 (2006.01); H01L 21/67 (2006.01); G03F 7/20 (2006.01); H01L 21/687 (2006.01); G01B 5/25 (2006.01);
U.S. Cl.
CPC ...
B23Q 3/186 (2013.01); G01B 5/25 (2013.01); G03F 7/70716 (2013.01); H01L 21/67259 (2013.01); H01L 21/68 (2013.01); H01L 21/68728 (2013.01);
Abstract

A tool set that can easily check positions of positioning pins for a workpiece even in an environment using a liquid is disclosed. The tool set includes: a reference tool to be placed on the holding stage; a dummy workpiece to be placed on the reference tool; and a check pin having a cylindrical circumferential surface. The reference tool has a central protrusion having a cylindrical circumferential surface. The dummy workpiece has a circular through-hole having a diameter larger than a diameter of the circumferential surface of the central protrusion. A diameter of the check pin is smaller than a value determined by dividing a difference between the diameter of the circular through-hole and the diameter of the circumferential surface of the central protrusion by 2.


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