The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Mar. 29, 2018
HI Llc, Los Angeles, CA (US);
Changhuei Yang, Pasadena, CA (US);
Adam Marblestone, Arlington, MA (US);
Jamu Alford, Simi Valley, CA (US);
Daniel Sobek, Portola Valley, CA (US);
HI LLC, Los Angeles, CA (US);
Abstract
An optical detection method and system are provided. Sample light is delivered into an anatomical structure having a target voxel, whereby a portion of the sample light passing through the target voxel is scattered by the anatomical structure as signal light, and another portion of the sample light not passing through the target voxel is scattered by the anatomical structure as background light that is combined with the signal light to create a sample light pattern. The sample light pattern and the reference light having an M number of different phases are concurrently combined to respectively generate an M number of interference light patterns. The M number of interference light patterns are detected. M pluralities of values representative of spatial components of the respective M number of interference light patterns are generated, and a physiologically-dependent optical parameter of the target voxel is determined based on the M pluralities of values.