The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Jul. 29, 2019
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Costel Biloiu, Rockport, MA (US);

Appu Naveen Thomas, Danvers, MA (US);

Tyler Rockwell, Wakefield, MA (US);

Frank Sinclair, Boston, MA (US);

Christopher Campbell, Newburyport, MA (US);

Assignee:

APPLIED Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01J 37/08 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32541 (2013.01); H01J 37/08 (2013.01); H01J 37/3255 (2013.01); H01J 37/32422 (2013.01);
Abstract

An ion beam processing apparatus may include a plasma chamber, and a plasma plate, disposed alongside the plasma chamber, where the plasma plate defines a first extraction aperture. The apparatus may include a beam blocker, disposed within the plasma chamber and facing the extraction aperture. The apparatus may further include a non-planar electrode, disposed adjacent the beam blocker and outside of the plasma chamber; and an extraction plate, disposed outside the plasma plate, and defining a second extraction aperture, aligned with the first extraction aperture.


Find Patent Forward Citations

Loading…