The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

May. 24, 2019
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Julio Cesar Zamora Esquivel, Guadalajara, MX;

Jose Rodrigo Camacho Perez, Guadalajara, MY;

Paulo Lopez Meyer, Guadalajara, MY;

Hector Alfonso Cordourier Maruri, Guadalajara, MY;

German Fabila Garcia, Guadalajara, MX;

Jesus Adan Cruz Vargas, Guadalajara, MX;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/01 (2006.01); G06T 7/90 (2017.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00335 (2013.01); G06F 3/017 (2013.01); G06T 7/90 (2017.01);
Abstract

In some embodiments, a method calculates a first color metric value from a detection window in a first image that is detected by a visual system. A second image of pixels is generated where the pixels include one or more second color metric values that meet the first color metric value within a threshold. The method compares the second image to an object. When the comparison meets a criterion, the method transitions from a first mode to a second mode. When the comparison does not meet the criterion, the method continues to operate in the first mode.


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