The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Nov. 11, 2014
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 17/38 (2006.01); G01R 33/00 (2006.01); G01C 25/00 (2006.01); G01R 33/028 (2006.01); G01C 19/56 (2012.01); G01R 33/022 (2006.01);
U.S. Cl.
CPC ...
G01C 17/38 (2013.01); G01C 19/56 (2013.01); G01C 25/005 (2013.01); G01R 33/00 (2013.01); G01R 33/0035 (2013.01); G01R 33/022 (2013.01); G01R 33/028 (2013.01);
Abstract
Systems and methods may provide for obtaining first sensor data associated with a gyroscope and obtaining second sensor data associated with a magnetometer. Additionally, the first sensor data, the second sensor data and an extended Kalman filter may be used to calibrate the magnetometer. In one example, a sampling rate of the magnetometer is increased before obtaining the second sensor data and the sampling rate of the magnetometer is decreased after calibration of the magnetometer.