The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

May. 18, 2020
Applicant:

Innogrit Technologies Co., Ltd., Shanghai, CN;

Inventors:

Lin Chen, Cupertino, CA (US);

Gang Zhao, Chandler, AZ (US);

Wei Jiang, Fremont, CA (US);

Shiann-Ming Liou, Campbell, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 22/32 (2013.01); H01L 24/03 (2013.01); H01L 24/05 (2013.01); H01L 24/06 (2013.01); H01L 2224/04042 (2013.01); H01L 2224/06177 (2013.01);
Abstract

Apparatus and methods are provided for bond bads layout and structure of semiconductor dies. According to various aspects of the subject innovation, the provided techniques may provide a semiconductor die that may comprise an outer bond pad elongated in a first direction parallel to an edge of the semiconductor die and an inner bond pad elongated in a second direction perpendicular to the edge of the semiconductor die. The outer bond pad may have a probing area and two wire bond areas aligned in the first direction and the inner bond pad may have one probing area and one wire bond area aligned in the second direction. The outer bond pad may be positioned closer to the edge of the semiconductor die than the inner bond pad.


Find Patent Forward Citations

Loading…