The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Dec. 13, 2018
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Claudio Giaccio, Torre del Greco, IT;

Erminio Di Martino, Quarto, IT;

Jeffery Carlos Bell, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/12 (2006.01); H04L 5/00 (2006.01); G06F 3/06 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 3/061 (2013.01); G06F 3/0634 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01); G06F 11/1072 (2013.01);
Abstract

Devices and techniques are disclosed herein for applying an effective sampling delay at a host device to one of an input signal, such as from an embedded MultiMediaCard (eMMC) device, or a clock signal. The host device can apply a configurable delay to one of the input signal or the clock signal with respect to a first edge of the clock signal, sample the input signal using the clock signal according to the configurable delay, and selectively align the sampled input signal to a subsequent, second edge of the clock signal to extend the configurable delay of the host device.


Find Patent Forward Citations

Loading…