The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
Aug. 21, 2018
Advantest Corporation, Tokyo, JP;
Bernhard Roth, Böblingen, DE;
Advantest Corporation, Tokyo, JP;
Abstract
The invention concerns devices and methods for calibrating an Automated Test Equipment for automated testing of a Device Under Test. The method includes providing two digital channel signals by two different channels of the Automated Test Equipment, wherein the digital channel signals include an identical or a complementary pattern with respect to their edges. The method further includes sum-combining or difference-combining the two digital channel signals in order to obtain a combined residual signal. The step of combining is performed such that combining provides a combined residual signal without a time-variant component if the two digital channel signals have a predetermined time shift or a predetermined phase shift relative to each other, or such that the combined residual signal includes a time variant component if the two digital channel signals have a time shift different from the predetermined time shift or a phase shift different from the predetermined phase shift.